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Microscopy, Atomic Force

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Definition: A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.     
See Also Microscopy, Scanning Tunneling 		Other names Scanning Force Microscopies; Microscopy, Scanning Force; Microscopy, Force; Microscopies, Scanning Force; Microscopies, Force; Microscopies, Atomic Force; Force Microscopy, Scanning; Force Microscopies, Scanning; Force Microscopies; Atomic Force Microscopies; Scanning Force Microscopy; Force Microscopy; Atomic Force Microscopy

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Sources: NLM Medical Subject Headings, NIH UMLS, Drugs@FDA, FDA AERS original data copyright United States Government. No endorsement implied. Last modified 6/6/2012
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