Definition: A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
Other names Scanning Force Microscopies; Microscopy, Scanning Force; Microscopy, Force; Microscopies, Scanning Force; Microscopies, Force; Microscopies, Atomic Force; Force Microscopy, Scanning; Force Microscopies, Scanning; Force Microscopies; Atomic Force Microscopies; Scanning Force Microscopy; Force Microscopy; Atomic Force Microscopy