Definition: Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
NIM; do not confuse with MICROSCOPY, ELECTRON, SCANNING TRANSMISSION or STEM; if in doubt, follow words of author; MICROSCOPY, SCANNING TUNNELING is also available
See AlsoCorrosion Casting
Other names Scanning Electron Microscopy; Scanning Microscopy, Electron; Scanning Microscopies, Electron; Scanning Electron Microscopies; Microscopy, Scanning Electron; Microscopy, Electron Scanning; Microscopies, Scanning Electron; Microscopies, Electron Scanning; Electron Scanning Microscopies; Electron Microscopy, Scanning; Electron Microscopies, Scanning; Electron Scanning Microscopy
