Definition: Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
DF: ELECTRON PROBE MICROANAL
Other names X-Ray Microanalysis, Electron Probe; X-Ray Microanalysis, Electron Microscopic; X-Ray Emission Spectrometry, Electron Probe; X-Ray Emission Spectrometry, Electron Microscopic; Spectrometry, X-Ray Emission, Electron Probe; Spectrometry, X-Ray Emission, Electron Microscopic; Microscopy, Electron, X-Ray Microanalysis; X Ray Microanalysis, Electron Probe; X Ray Microanalysis, Electron Microscopic; X Ray Microanalysis; Probe Microanalysis, Electron; Probe Microanalyses, Electron; Microanalysis, X-Ray; Microanalyses, Electron Probe; Electron Probe Microanalyses; X-Ray Microanalysis; X Ray Emission Spectrometry, Electron Probe; X Ray Emission Spectrometry, Electron Microscopic; Spectrometry, X Ray Emission, Electron Probe; Spectrometry, X Ray Emission, Electron Microscopic
